Robert Lipman, Research Engineer, Systems Engineering Group at NIST has developed new software to 'analyze' Quality Information Framework (QIF) files. The software is based on ideas from his STEP File Analyzer software, for which he was awarded the Department of Commerce Bronze Medal. The new QIF software is called 'QIF PMI Report', or QPR. The objective is to generate a…
April 18th, 2024 – The Digital Metrology Standards Consortium (DMSC) is pleased to announce that Mark Thomas, Executive Director, has been honored with a Recognition Award for his leadership and dedication in advancing the DMSC vision. The award, presented by the DMSC’s Rosemary Astheimer, Recognition Committee Chair, and Curtis Brown, President, acknowledges Mark's exceptional contributions to the organization. Throughout his tenure, he has consistently gone…
Although DMSC had plenty of activity to show at the recent QIF Summit, planning for the future is also an important task. Input from our membership is key to developing projects and programs that are relevant to the DMSC and QIF community. As an organization with limited resources, it is essential to deploy our DMSC talent and assets in a…
April 16th - 19th, 2024 - The Manufacturing x Digital (MxD) in Chicago hosted the 2024 MBE/QIF Summit which was jointly organized by NIST and DMSC. The event was attended by nearly 200 individuals and featured over 30 technical sessions along with a factory automation tour at the MxD facility. The MBE Summit was held on Tuesday and Wednesday, featuring presentations on Model-Based Enterprise (MBE)…
After a multi-year hiatus, the popular 3D CIC event was back for 2024 with a technical program loaded with fascinating presentations relating to the latest technology and best practices for sharing 3D data across different software platforms. Held in Golden, CO, March 4 – 7, the Colorado School of Mines was a comfortable venue for the 30+ presenters, many of…
DMSC has been pleased with the rate of worldwide QIF adoption throughout the industrial manufacturing universe, so far. As success stories evolve, so does the need to share those stories. When companies look back on their success it is easy to see how some of that experience and knowledge would benefit other companies just beginning the MBD and QIF journey.…
A premier joint event is planned for April 2024 – the Quality Information Framework (QIF) Summit along with the highly popular Model-Based Enterprise (MBE) Summit, featuring technical content organized by DMSC and NIST, respectively. The event venue will be the Chicago Manufacturing x Digital (MxD) facility. It will include three and a half days of MBE and QIF technical presentations,…
The upcoming 3D CIC event will have plenty of “DMSC theme” as there will be numerous DMSC members making presentations. The 3D CIC brings together industry leaders, cross-functional engineers, and 3D Data practitioners as well as stakeholders who collaborate with or support these areas. 3D CIC strongly emphasizes the interoperability and social science aspects of whole enterprise success. Planned presentations…
For February 2024, DMSC is pleased to announce the addition of two new DMSC members: Discus Software former DMSC member from 2013, Discus Software has rediscovered QIF and has recognized the benefits of working collaboratively with other companies in the metrology community. Based in Fairborn, Ohio, Discus specializes in the development of software tools for accelerating manufacturing and quality engineering.…
If you visited IMTS in 2022 and had trouble finding the DMSC booth, you weren’t alone. For 2024, DMSC is pleased to announce our new “main street” booth location on the main aisle in the East Building, Level 3. The new DMSC booth number is 135001, kitty-corner to the OGP booth. Compared to previous years, note the entire Quality Assurance category of exhibitors…
The Digital Metrology Standards Organization's member companies and organizations represent innovative, progressive, and advanced organizations, each on the cutting edge of research and technology in digital metrology.