A newly drafted Model-Based Characteristics (MBC) standard from DMSC was introduced by Curtis Brown, DMSC President and Co-Chair of the MBC Working Group, at the PTC/User Global Summit in Orlando (FL) on January 22 – 24, 2024. A three-day event, the PTC/User Global Summit is a User-to-User experience that brings users of PTC software together for the exchange of application information, offering informational sessions, networking opportunities, and…
A premier joint event is being planned for 2024 – a QIF Summit held in conjunction with the highly popular MBE Summit, featuring technical content organized by NIST and DMSC. The event venue will be the MxD facility in Chicago and will include three and a half days of MBE and QIF-centric technical presentations, roundtable discussions, and informational sessions from NIST and DMSC. The MBE Summit is scheduled…
A premier joint event is being planned for 2024 – a QIF Summit held in conjunction with the highly popular MBE Summit, featuring technical content organized by NIST. The event venue will be the MxD facility in Chicago and will include three and a half days of MBE and QIF-centric technical presentations, roundtable discussions, and informational sessions from NIST and…
The DMSC is pleased to announce results for the recent 2024 – 2026 Board of Directors elections that concluded on November 29, 2023. Elected from a field of six highly qualified nominees, the two successful candidates are Jennifer Herron (Action Engineering) and Hermitt Vega (Pratt & Whitney) who will be serving as DMSC Board members for a three-year term. . …
MBE Summit by NIST and QIF Summit by DMSC Events Revitalized Back by popular demand, the MBE Summit from NIST and QIF Summit by DMSC are returning! NIST and DMSC will be presenting a joint event at the MxD facility in Chicago, IL. The MBE Summit will be April 16 - 17, 2024, and the QIF Summit will be April…
DMSC Board of Directors Meeting from your computer, tablet or smartphone. These meetings are open exclusively to Directors of the Digital Metrology Standards Consortium. Agendas will be announced by separate email to the Directors relevant to priorities and goals set by the Officers and Directors of the DMSC, including the DMSC 2020+ Roadmap, DMSC Working Groups activities, QIF 4.0 (next…
Join our monthly DMSC General Membership meeting from your computer, tablet or smartphone. These meetings are exclusive to all members of the Digital Metrology Standards Consortium. Attendees receive news and information about the latest activities of the DMSC Working Groups, ANSI and ISO related initiatives, as well as updates from those organizations who are implementing the QIF/ISO 23952:2020 standard. Subscribe…
The Digital Metrology Standards Consortium (DMSC) is pleased to announce the launch of a new streamlined logo as part of an ongoing evolution of our organization’s focus and goals. The DMSC mission has grown and evolved since our founding in 2005, and we felt it was time for a change. We have refreshed our logo to reflect and emphasize our…
The DMSC Board of Director election concluded on January 8, 2021 and DMSC is pleased to announce the following results: There were two 2021 - 2023 term BoD positions available, with Jennifer Herron (Action Engineering) being re-elected, and the election of Larry Maggiano (Mitutoyo), as a new Board member. The new/renewed Board members will commence their service immediately. The DMSC…
New ISO Standard Offers Integrated Model for Manufacturing Quality Information The Digital Metrology Standards Consortium recently had their ANSI/DMSC QIF 3.0 metrology standard harvested, approved, and published by ISO as the new ISO Standard ISO 23952:2020. DMSC is the developer and maintainer of QIF (Quality Information Framework), and other metrology standards. These standards are intended to help advanced manufacturers reduce…
The Digital Metrology Standards Organization's member companies and organizations represent innovative, progressive, and advanced organizations, each on the cutting edge of research and technology in digital metrology.