Near record temperatures in Texas did not deter the DMSC Standards Committee (SC) from meeting in Ft. Worth (TX) to determine the suitability of a Model-Based Characteristics (MBC) Working Group (WG) proposal to ANSI. Nearly twenty companies attended the in-person meeting, held at the University of Texas at Arlington (UTARI), June 20 – 22, 2023. The inaugural MBC WG was…
DMSC Founder, soft-spoken Bailey H. Squier, brought laughter and memories of the “old days” of DMIS and DMSC during his unannounced visit to recent Standards Committee (SC) meeting held in Arlington, Texas June 20-22, 2023. His humor and wit brought smiles to all in attendance as he recounted the formation of the Digital Metrology Standards Consortium. [caption id="attachment_5950" align="alignright" width="400"]…
DMSC Marketing Chair Ray Stahl sat down with QIF 4.0 Project Manager Tom Kramer to review the most common questions asked during QIF 4.0 Working Group sessions. Following is a recap of their discussion. • Optical digitizer measurement devices are being added to QIF measurement resources. An optical digitizer creates clouds of 3D points. Other additions and improvements to the…
DMSC will be represented at the upcoming ISO TC 184 event in Paris (Saint-Denis, France) June 12 – 15, 2023. Jennifer Herron, Action Engineering CEO and DMSC Board Member, has been designated as an official DMSC Liaison to ISO. The event will include the Plenary Meeting of ISO/TC 184 and its subcommittees, working groups, and task forces. The International Organization…
DMSC has been searching for ways to accelerate worldwide Quality Information Framework/QIF adoption. Increasing the availability of QIF Subject Matter Experts (SME) will add exposure and expertise of QIF within the metrology community. The DMSC Board of Directors (BoD) has approved the formation of a new Working Group to pursue development of a formal Training/Certification program. Development of a multi-tiered…
The QIF 4.0 Working Group is looking for someone to help manage the regular meetings (1 hour, roughly every-other-week), when and if the current Chair, Daniel Campbell, is away on business travel. The level-of-effort and time commitment for this Vice-Chair position should be fairly low. Daniel is available roughly 90% of the time, with the Vice-Chair to assume the role…
Last month we announced that DMSC Director of Marketing, Ray Stahl would attend the Control International Trade Fair 2023. Following is a short summary of his visit. Our purpose for attending the 35th Control Show for the DMSC was to: • Promote the Quality Information Framework (QIF) standard at the largest quality inspection show with the most significant number of…
The Model-Based Characteristics (MBC) Working Group (WG) is nearing completion of a new proposed metrology standard: MBC 1.0. WG co-Chair Mark Nielson (TechAzul) has indicated that a finished document should be ready for submission to the DMSC Standards Committee in just a few weeks. The process of moving from WG to the DMSC Standards Committee to ANSI is defined in…
DMSC will be presenting “ISO 23952 – Enabling DX through standardization of manufacturing, test, and inspection data created both internally and by our supply chain” at the upcoming 38th Annual Coordinate Metrology Society Conference (CMSC) in Mobile, Alabama, July 10-14, 2023. The DMSC developed QIF 3.0 (Quality Information Framework) metrology standard has an ISO designation of ISO 23952:2020. The Coordinate…
DMSC will be represented at the 35th Annual Control International Trade Fair for Quality Assurance in Stuttgart, Germany, 9 - 12 May 2023. DMSC’s Marketing Director, Ray Stahl, will be in attendance at the show, evangelizing QIF (Quality Information Framework) adoption and recruiting for membership in Digital Metrology Standards Consortium. Multiple DMSC member companies will be among the 760+ exhibitors…
The Digital Metrology Standards Organization's member companies and organizations represent innovative, progressive, and advanced organizations, each on the cutting edge of research and technology in digital metrology.