FOR IMMEDIATE RELEASE Fort Worth, TX / Rochester, NY August 2, 2021 PDES, Inc. and DMSC, Inc. Sign Memorandum of Understanding PDES, Inc. is pleased to announce the signing of a Memorandum of Understanding (MoU) with the Digital Metrology Standards Consortium (DMSCTM, Inc.). Both organizations seek to improve the ways tools work together to improve standards development, analysis, and define…
The Digital Metrology Standards Consortium (DMSC) is pleased to announce the launch of a new streamlined logo as part of an ongoing evolution of our organization’s focus and goals. The DMSC mission has grown and evolved since our founding in 2005, and we felt it was time for a change. We have refreshed our logo to reflect and emphasize our…
Metromeet is an International Conference on Industrial Dimensional Metrology since 2005 and a key meeting point for Metrology professionals. Traditionally held in Bilbao, Spain, the 2021 event will be held virtually on March 25, 2021. Everyday QIF Explained at Metromeet Jennifer Herron, CEO of Action Engineering (Golden, Colorado, USA) and Board Director of Digital Metrology Standards Consortium (DMSC), will present…
The recent 3-part QIF webinar series exceeded registration and attendance expectations and produced excellent reviews by many participants. The webinars, each running about 40 minutes, covered QIF basics (QIF 101), QIF schema (QIF 201) and more advanced applications (QIF 301). The webinar series was marketed through a series of email blasts and the DMSC newsletter. Webinar attendance: QIF 101; Understanding…
With the cancellation of the NIST 2020 MBE Summit, Digital Metrology Standards Consortium (DMSC) instead conducted a series of 40-minute webinars presenting content originally intended as Quality Information Framework (QIF) tutorials at the 2020 MBE Summit. Webinar: QIF 201 Outlining the QIF Schemas Date: Thursday, April 30, 2020 This event has now passed; however the webinar was recorded and is…
With the cancellation of the NIST 2020 MBE Summit, Digital Metrology Standards Consortium (DMSC) instead conducted a series of 40-minute webinars presenting content originally intended as Quality Information Framework (QIF) tutorials at the 2020 MBE Summit. Webinar: QIF 101 Understanding QIF Basics Date: Thursday, April 23, 2020 This event has now passed; however the webinar was recorded and is now…
This paper was presented at the NIST MBE Summit in April 2019. It discusses how the ANSI DMSC Quality Information Framework (QIF) standard provides benefit to the Model-Based Enterprise (MBE) in two important ways: (1) automation of cyber-physical processes, allowing faster realization of higher quality products at lower cost, and (2) by providing traceability of massive quantities of measurement-related data…
How the ANSI/DMSC Quality Information Framework (QIF) standard provides benefit to the Model-Based Enterprise (MBE) will be presented by Curtis Brown, President of the DMSC and a panel of experts at the 2019 MBE Summit. QIF standard benefits MBE in two important ways: (1) automation of cyber-physical processes, allowing faster realization of higher quality products at lower cost, and (2)…
QIF for Industry: Open Round-Table Forum NIST MBE Summit April 1-4, 2019 Gaithersburg, MD You are invited to join an open round-table discussion with representatives from the QIF Community, authors, implementers, users, and thought leaders at the NIST MBE Summit 2019. Those at the table will discuss the scope and uses for the new ANSI/DMSC QIF v3.0 standard and status…
Digital Metrology Standards Consortium (DMSC) recently announced the release of the updated version of the Quality Information Framework (QIF) Standard: QIF 3.0. Under the DMSC, a working group develops Rule Types and eXtensible Markup Language (XML) Schema in the QIF standard. The goal is to develop a rule model, i.e., the standard of representing rules used in inspection process planning.…
The Digital Metrology Standards Organization's member companies and organizations represent innovative, progressive, and advanced organizations, each on the cutting edge of research and technology in digital metrology.